Radical Enhanced Atomic Layer Deposition of Metals and Oxides
Type:
Thesis
Info:
Niskanen Thesis
Date:
2006-11-10
Author Information
Name | Institution |
---|---|
Antti Niskanen | University of Helsinki |
Films
Plasma TiN
Plasma TiN
Plasma Al
Plasma Al
Plasma Al
Plasma AlN
Plasma Ru
Plasma Ta
Plasma Nb
Plasma Hf
Plasma Cr
Plasma Mo
Plasma Ni
Plasma CuOx
Plasma CuOx
Plasma SrTiO3
Plasma SiO2
Plasma ZnO
Plasma Nb2O5
Plasma Cr2O3
Plasma RuO2
Plasma NiOx
Film/Plasma Properties
Substrates
Notes
Thesis covers 5 materials: Al2O3, Ta2O5, TiO2, Cu, and Ag. Films listed on this page either did not work at the chosen experimental conditions or the resulting films were less studied. Consult tables 6 and 10 in the thesis for further information. |
87 |