Title: Encapsulation method for atom probe tomography analysis of nanoparticles
Type: Journal
Info: Ultramicroscopy, Available online 24 February 2015
Date: 2015-04-28
DOI: http://dx.doi.org/10.1021/acsami.5b00677
Name
Institution
CAMECA Instruments Inc.
CAMECA Instruments Inc.
Eindhoven University of Technology
Eindhoven University of Technology
CAMECA Instruments Inc.
Eindhoven University of Technology
CAMECA Instruments Inc.
Eindhoven University of Technology
CAMECA Instruments Inc.
CAMECA Instruments Inc.
Characteristic
Analysis
Diagnostic
Images
APT, Atom Probe Tomography
CAMECA Instruments LEAP 4000X HR
Images
TEM, Transmission Electron Microscope
JEOL JEM ARM 200
329
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