About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Plasma enhanced atomic layer deposition of a (nitrogen doped) Ti phosphate coating for improved energy storage in Li-ion batteries

Type:
Journal
Info:
Journal of Power Sources 497 (2021) 229866
Date:
2021-03-27

Author Information

Name Institution
Lowie HenderickGhent University
Ahmed HamedHasselt University
Felix MattelaerGhent University
Matthias M. MinjauwGhent University
Mikko NisulaGhent University
Johan MeersschautIMEC
Jolien DendoovenGhent University
Mohammadhosein SafariHasselt University
Philippe M VereeckenIMEC
Christophe DetavernierGhent University

Films

Plasma TiP2O7


Plasma TiP2O7


Plasma N:TiP2O7


Plasma N:TiP2O7


Plasma TiP2O7


Plasma N:TiP2O7


Plasma TiP2O7


Plasma N:TiP2O7


Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Thickness
Analysis: XRR, X-Ray Reflectivity

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy

Characteristic: Chemical Composition, Impurities
Analysis: TOF-ERDA, Time-Of-Flight Elastic Recoil Detection Analysis

Characteristic: Electrochemical Performance
Analysis: Electrochemical Analysis

Substrates

Si(100)

Notes

Nice TMP and DEPA decomposition data
1720