Micro-Raman Spectroscopy for Monitoring of Deposition Quality of High-k Stack Protective Layer onto Nanowire FET Chips for Highly Sensitive miRNA Detection
Type:
Journal
Info:
Biosensors 2018, 8, 72
Date:
2018-07-28
Author Information
Name | Institution |
---|---|
Kristina A Malsagova | Institute of Biomedical Chemistry |
Tatyana O Pleshakova | Institute of Biomedical Chemistry |
Andrey F Kozlov | Institute of Biomedical Chemistry |
Ivan D Shumov | Institute of Biomedical Chemistry |
Mikhail A. Ilnitskii | Russian Academy of Sciences |
Andrey V. Miakonkikh | Moscow Institute of Physics and Technology |
Vladimir P. Popov | Russian Academy of Sciences |
Konstantin V. Rudenko | Russian Academy of Sciences |
Alexander V. Glukhov | Novosibirsk Semiconductor Device Plant and Design Bureau |
Igor N. Kupriyanov | Russian Academy of Sciences |
Nina D. Ivanova | Skryabin Moscow State Academy of Veterinary Medicine and Biotechnology |
Alexander E. Rogozhin | Moscow Institute of Physics and Technology |
Alexander I. Archakov | Institute of Biomedical Chemistry |
Yuri D. Ivanov | Institute of Biomedical Chemistry |
Films
Plasma HfO2
Plasma Al2O3
Film/Plasma Properties
Substrates
Silicon |
Notes
1299 |