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Characterization of AlON-TiON Stacked Insulators For ZnS:Mn Thin Film Electroluminescent Devices
Type:
Journal
Info:
Electrochemical and Solid-State Letters, 7 (9) H33-H35 (2004)
Date:
2004-01-02
Author Information
| Name | Institution |
|---|---|
| Jung Wook Lim | Electronics and Telecommunication Research Institute, (ETRI) |
| Sun Jin Yun | Electronics and Telecommunication Research Institute, (ETRI) |
Films
Thermal TiO2
Plasma TiON
Plasma AlON
Film/Plasma Properties
Characteristic: Breakdown Voltage
Analysis: I-V, Current-Voltage Measurements
Characteristic: Leakage Current
Analysis: I-V, Current-Voltage Measurements
Substrates
| ITO |
| ZnS:Mn |
Notes
| 1166 |