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Atomic Layer Deposited Electron Transport Layers in Efficient Organometallic Halide Perovskite Devices
Type:
Journal
Info:
MRS Advances, Volume 3, Issue 51 (Energy Materials and Technologies) 2018 , pp. 3075-3084
Date:
2018-07-03
Author Information
| Name | Institution |
|---|---|
| Melissa M. McCarthy | Tyndall National Institute, University College Cork |
| Arnaud Walter | Centre Suisse d'Electronique et de Microtechnique (CSEM) |
| Soo-Jin Moon | Centre Suisse d'Electronique et de Microtechnique (CSEM) |
| Nakita K. Noel | University of Oxford |
| Shane O'Brien | Tyndall National Institute, University College Cork |
| Martin E. Pemble | Tyndall National Institute, University College Cork |
| Sylvain Nicolay | Centre Suisse d'Electronique et de Microtechnique (CSEM) |
| Bernard Wenger | University of Oxford |
| Henry J. Snaith | University of Oxford |
| Ian M. Povey | Tyndall National Institute, University College Cork |
Films
Thermal TiO2
Plasma TiO2
Thermal TiO2
Plasma TiO2
Thermal SnO2
Film/Plasma Properties
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy
Characteristic: Conductivity
Analysis: -
Characteristic: Wetting Angle
Analysis: Contact Angle Measurement
Characteristic: Optical Properties
Analysis: UV-VIS Spectroscopy
Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Characteristic: Open Circuit Voltage
Analysis: I-V, Current-Voltage Measurements
Characteristic: Short Circuit Current
Analysis: I-V, Current-Voltage Measurements
Characteristic: Fill Factor
Analysis: I-V, Current-Voltage Measurements
Characteristic: Power Conversion Efficiency
Analysis: I-V, Current-Voltage Measurements
Characteristic: Efficiency
Analysis: I-V, Current-Voltage Measurements
Characteristic: Images
Analysis: TEM, Transmission Electron Microscope
Substrates
| FTO, F:SnO2 |
Notes
| 1414 |