
Effect of Plasma-Enhanced Atomic Layer Deposition on Oxygen Overabundance and Its Influence on the Morphological, Optical, Structural, and Mechanical Properties of Al-Doped TiO2 Coating
Type:
Journal
Info:
Micromachines 2021, 12, 588
Date:
2021-05-19
Author Information
| Name | Institution |
|---|---|
| William Chiappim | Instituto Tecnológico de Aeronáutica (ITA-DCTA) |
| Giorgio E. Testoni | Instituto Tecnológico de Aeronáutica (ITA-DCTA) |
| Felipe Miranda | Instituto Tecnológico de Aeronáutica (ITA-DCTA) |
| Mariana A. Fraga | Universidade Federal de São Paulo |
| Humber Furlan | Centro Estadual de Educação Tecnológica Paula Souza |
| David Ardiles Saravia | Grenoble Alps University (UGA) |
| Argemiro da Silva Sobrinho | Instituto Tecnológico de Aeronáutica (ITA-DCTA) |
| Gilberto Petraconi | Instituto Tecnológico de Aeronáutica (ITA-DCTA) |
| Homero S. Maciel | Instituto Tecnológico de Aeronáutica (ITA-DCTA) |
| Rodrigo S. Pessoa | Instituto Tecnológico de Aeronáutica (ITA-DCTA) |
Films
Plasma AlTixOy
Thermal AlTixOy
Plasma Al2O3
Thermal Al2O3
Plasma TiO2
Thermal TiO2
Film/Plasma Properties
Characteristic: Thickness
Analysis: RBS, Rutherford Backscattering Spectrometry
Characteristic: Chemical Composition, Impurities
Analysis: RBS, Rutherford Backscattering Spectrometry
Characteristic: Hardness
Analysis: Nanoindentation
Characteristic: Young's Modulus
Analysis: Nanoindentation
Characteristic: Elastic Modulus
Analysis: Nanoindentation
Characteristic: Raman Spectra
Analysis: Raman Spectroscopy
Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Characteristic: Transmittance
Analysis: UV-VIS Spectroscopy
Characteristic: Reflectance Spectra
Analysis: UV-VIS Spectroscopy
Characteristic: Band Gap
Analysis: Ellipsometry
Substrates
| Si(100) |
| soda lime glass |
Notes
| 1625 |
