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Ru Thin Film Formation Using Oxygen Plasma Enhanced ALD and Rapid Thermal Processing

Type:
Journal
Info:
Material Science Forum, vol. 815, pp. 8-13, 2015
Date:
2015-03-20

Author Information

Name Institution
Chun Min ZhangFudan University
Xiao Yong LiuFudan University
Lin Qing ZhangFudan University
Hong Liang LuFudan University
Peng Fei WangFudan University
David Wei ZhangFudan University

Films

Plasma RuO2

Hardware used: Beneq TFS-200


CAS#: 7782-44-7

Film/Plasma Properties

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy

Characteristic: Thickness
Analysis: TEM, Transmission Electron Microscope

Substrates

TiN

Notes

528