About Plasma ALD, LLC

The Plasma Enhanced Atomic Layer Deposition Publication Database is developed and maintained by Plasma ALD, LLC, a developer and supplier of inductively coupled plasma (ICP) sources for plasma-enhanced atomic layer deposition (PEALD), atomic layer etch (ALE), thin-film etching, surface cleaning, surface modification, and research plasma systems.

Our ICP sources are designed for integration with existing ALD and vacuum-processing equipment. Plasma ALD also provides plasma-source integration, process-development, and troubleshooting assistance based on decades of experience with low-pressure plasma processing and PEALD systems.

Researchers, universities, equipment manufacturers, and laboratories looking for an ICP plasma source or assistance adding plasma capability to a vacuum system can learn more on our Plasma Sources page.

Ultrasensitive Detection of 2,4-Dinitrophenol Using Nanowire Biosensor

Type:
Journal
Info:
Journal of Nanotechnology Volume 2018, Article ID 9549853
Date:
2018-08-13

Author Information

Name Institution
Yuri D. IvanovInstitute of Biomedical Chemistry
Kristina A MalsagovaInstitute of Biomedical Chemistry
Tatyana O PleshakovaInstitute of Biomedical Chemistry
Rafael A GaliullinInstitute of Biomedical Chemistry
Andrey F KozlovInstitute of Biomedical Chemistry
Ivan D ShumovInstitute of Biomedical Chemistry
Irina A IvanovaInstitute of Biomedical Chemistry
Alexander I. ArchakovInstitute of Biomedical Chemistry
Vladimir P. PopovRussian Academy of Sciences
Alexander V LatyshevRussian Academy of Sciences
Konstantin V. RudenkoRussian Academy of Sciences
Alexander V. GlukhovNovosibirsk Semiconductor Device Plant and Design Bureau

Films

Plasma HfO2


Plasma Al2O3


Film/Plasma Properties

Substrates

Notes

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