
Toward Understanding Positive Bias Temperature Instability in Fully Recessed-Gate GaN MISFETs
Type:
Journal
Info:
IEEE Transactions on Electron Devices, Volume:63, Issue:5, 2016
Date:
2016-02-29
Author Information
Name | Institution |
---|---|
Tian-Li Wu | IMEC |
Jacopo Franco | IMEC |
Denis Marcon | IMEC |
Brice De Jaeger | IMEC |
Benoit Bakeroot | IMEC |
Steve Stoffels | IMEC |
Marleen Van Hove | IMEC |
Guido Groeseneken | IMEC |
Stefaan Decoutere | IMEC |
Films
Film/Plasma Properties
Characteristic: Transistor Characteristics
Analysis: Transistor Characterization
Substrates
GaN |
Notes
975 |