Toward Understanding Positive Bias Temperature Instability in Fully Recessed-Gate GaN MISFETs
Type:
Journal
Info:
IEEE Transactions on Electron Devices, Volume:63, Issue:5, 2016
Date:
2016-02-29
Author Information
| Name | Institution |
|---|---|
| Tian-Li Wu | IMEC |
| Jacopo Franco | IMEC |
| Denis Marcon | IMEC |
| Brice De Jaeger | IMEC |
| Benoit Bakeroot | IMEC |
| Steve Stoffels | IMEC |
| Marleen Van Hove | IMEC |
| Guido Groeseneken | IMEC |
| Stefaan Decoutere | IMEC |
Films
Film/Plasma Properties
Characteristic: Transistor Characteristics
Analysis: Transistor Characterization
Substrates
| GaN |
Notes
| 975 |