Introducing Plasma ALD, LLC's first in-house product.

An economical, compact inductively coupled plasma source.

Ideal for:

  • Plasma-Enhanced Atomic Layer Deposition
  • Thin Film Etch
  • Surface cleaning
  • Surface modification

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RF Characterization of Novel Superconducting Materials and Multilayers

Type:
Conference Proceedings
Info:
SRF2019, Dresden, Germany
Date:
2019-06-30

Author Information

Name Institution
T. OseroffCornell University
M. LiepeCornell University
B. MoecklySTAR Cryoelectronics
Mark J. SowaVeeco Instruments
Zhipei SunCornell University

Films



Film/Plasma Properties

Characteristic: Superconductivity
Analysis: -

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction

Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy

Substrates

AlN
Nb

Notes

1736