
Study of the surface species during thermal and plasma-enhanced atomic layer deposition of titanium oxide films using in situ IR-spectroscopy and in vacuo X-ray photoelectron spectroscopy
Type:
Journal
Info:
Phys. Chem. Chem. Phys., 2020, 22, 9262-9271
Date:
2020-04-07
Author Information
| Name | Institution |
|---|---|
| Sofie S. T. Vandenbroucke | Ghent University |
| Elisabeth Levrau | Ghent University |
| Matthias M. Minjauw | Ghent University |
| Michiel Van Daele | Ghent University |
| Eduardo Solano | Ghent University |
| Rita Vos | IMEC |
| Jolien Dendooven | Ghent University |
| Christophe Detavernier | Ghent University |
Films
Plasma TiO2
Plasma TiO2
Thermal TiO2
Film/Plasma Properties
Characteristic: Surface Reactions
Analysis: FTIR, Fourier Transform InfraRed spectroscopy
Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Characteristic: Bonding States
Analysis: XPS, X-ray Photoelectron Spectroscopy
Substrates
| TiN |
| Silicon |
Notes
| 1501 |
