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Properties of plasma enhanced atomic layer deposited ruthenium thin films from Ru(EtCp)2

Type:
Journal
Info:
Journal of Physics: Conference Series 2086 (2021) 012209
Date:
2021-09-07

Author Information

Name Institution
Elizaveta SmirnovaRussian Academy of Sciences
Andrey V. MiakonkikhRussian Academy of Sciences
Alexander E. RogozhinRussian Academy of Sciences
Konstantin V. RudenkoRussian Academy of Sciences

Films

Plasma RuO2


Plasma Ru


Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Thickness
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Stress
Analysis: Wafer Curvature

Substrates

Silicon
SiO2
TaN

Notes

1735