
The role of active species in the N2 and N2-H2 RF afterglows on selective surface nitriding of ALD-grown TiO2 films
Type:
Journal
Info:
Surface & Coatings Technology 324 (2017) 243-248
Date:
2017-05-29
Author Information
| Name | Institution |
|---|---|
| Yunfei Wang | Ajou University |
| Andre Ricard | Université de Toulouse |
| Jean-Philippe Sarrette | Université de Toulouse |
| Ansoon Kim | Korea Research Institute of Standards and Science (KRISS) |
| Yu Kwon Kim | Ajou University |
Films
Film/Plasma Properties
Characteristic: Plasma Species
Analysis: OES, Optical Emission Spectroscopy
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Substrates
| Si(111) |
Notes
| 1651 |
