Thin film GaP for solar cell application

Type:
Journal
Info:
Journal of Physics: Conference Series 741 (2016) 012088
Date:
2016-09-22

Author Information

Name Institution
Ivan A. MorozovSt. Petersburg Academic University
Alexander S. GudovskikhSt. Petersburg Academic University
Dmitry A. KudryashovSt. Petersburg Academic University
E.V. NikitinaSt. Petersburg Academic University
Jean-Paul KleiderGeePs Group of electrical engineering - Paris
A V MyasoedovIoffe Institute
V LevitskiyResearch and development center for thin-film technologies in energetics

Films

Plasma GaP


Film/Plasma Properties

Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Thickness
Analysis: SEM, Scanning Electron Microscopy

Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy

Characteristic: Images
Analysis: TEM, Transmission Electron Microscope

Characteristic: Interlayer
Analysis: TEM, Transmission Electron Microscope

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: Electron Diffraction

Characteristic: Refractive Index
Analysis: Ellipsometry

Characteristic: Extinction Coefficient
Analysis: Ellipsometry

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Substrates

Si(100)

Notes

911