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Stability of effective lifetime of float-zone silicon wafers with AlOx surface passivation schemes under illumination at elevated temperature
Type:
Conference Proceedings
Info:
Energy Procedia 124 (2017) 146-151
Date:
2017-04-03
Author Information
| Name | Institution |
|---|---|
| Tim Niewelt | Fraunhofer Institute for Solar Energy Systems (ISE) |
| Wolfram Kwapil | Fraunhofer Institute for Solar Energy Systems (ISE) |
| Marisa Selinger | Freiburg Materials Research Center FMF |
| Armin Richter | Fraunhofer Institute for Solar Energy Systems (ISE) |
| Martin C. Schubert | Fraunhofer Institute for Solar Energy Systems (ISE) |
Films
Film/Plasma Properties
Characteristic: Minority Carrier Lifetime
Analysis: QSSPC, Quasi-Steady-State PhotoConductance Decay
Substrates
| Silicon |
Notes
| 1129 |