Publication Information

Title:
Nanostructure and temperature-dependent photoluminescence of Er-doped Y2O3 thin films for micro-optoelectronic integrated circuits
Type:
Journal
Info:
Journal of Applied Physics 100, 073512 (2006)
Date:
2006-06-16

Author Information

Name Institution
Trinh Tu VanUniversity of California - Los Angeles (UCLA)
J. HoangUniversity of California - Los Angeles (UCLA)
R. OstroumovUniversity of California - Los Angeles (UCLA)
K. L. WangUniversity of California - Los Angeles (UCLA)
John R. BargarSLAC National Accelerator Laboratory
J. LuUppsala University
H.-O. BlomUppsala University
Jane P. ChangUniversity of California - Los Angeles (UCLA)

Films


Film/Plasma Properties

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy

Characteristic: Chemical Composition, Impurities
Analysis: RBS, Rutherford Backscattering Spectrometry

Characteristic: Microstructure
Analysis: EXAFS, Extended X-ray Absorption Fine Structure

Characteristic: Microstructure
Analysis: TEM, Transmission Electron Microscope

Characteristic: Chemical Composition, Impurities
Analysis: ELS, EELS, Electron Energy Loss Spectroscopy

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: Electron Diffraction

Substrates

Si(100)

Keywords

Notes

1315