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Atomic layer epitaxy of germanium

Type:
Journal
Info:
Applied Surface Science 82-83 (1994) 380-386
Date:
1994-06-30

Author Information

Name Institution
Satoshi SugaharaTokyo Institute of Technology
Takuya KitamuraTokyo Institute of Technology
Toshinori ImaiTokyo Institute of Technology
Masakiyo MatsumuraTokyo Institute of Technology

Films

Plasma Ge

Hardware used: Custom Hot-wire


CAS#: 1333-74-0

Film/Plasma Properties

Characteristic: Thickness
Analysis: Profilometry

Substrates

Ge
SiO2

Notes

1600