Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range
Type:
Journal
Info:
Adv. Optical Mater. 2016, 4, 1780--1786
Date:
2016-06-08
Author Information
Name | Institution |
---|---|
Thomas Siefke | Friedrich-Schiller-Universität Jena |
Stefanie Kroker | Technische Universität Braunschweig |
Kristin Pfeiffer | Friedrich-Schiller-Universität Jena |
Oliver Puffky | Friedrich-Schiller-Universität Jena |
Kay Dietrich | Friedrich-Schiller-Universität Jena |
Daniel Franta | Masaryk University |
Ivan Ohlídal | Masaryk University |
Adriana Szeghalmi | Friedrich-Schiller-Universität Jena |
Ernst-Bernhard Kley | Friedrich-Schiller-Universität Jena |
Andreas Tünnermann | Friedrich-Schiller-Universität Jena |
Films
Plasma TiO2
Film/Plasma Properties
Characteristic: Thickness
Analysis: Ellipsometry
Characteristic: Refractive Index
Analysis: Ellipsometry
Characteristic: Transmittance
Analysis: Optical Transmission
Characteristic: Reflectivity
Analysis: Optical Reflectivity
Substrates
SiO2 |
Notes
877 |