
Materials Pushing the Application Limits of Wire Grid Polarizers further into the Deep Ultraviolet Spectral Range
Type:
Journal
Info:
Adv. Optical Mater. 2016, 4, 1780--1786
Date:
2016-06-08
Author Information
| Name | Institution |
|---|---|
| Thomas Siefke | Friedrich-Schiller-Universität Jena |
| Stefanie Kroker | Technische Universität Braunschweig |
| Kristin Pfeiffer | Friedrich-Schiller-Universität Jena |
| Oliver Puffky | Friedrich-Schiller-Universität Jena |
| Kay Dietrich | Friedrich-Schiller-Universität Jena |
| Daniel Franta | Masaryk University |
| Ivan Ohlídal | Masaryk University |
| Adriana Szeghalmi | Friedrich-Schiller-Universität Jena |
| Ernst-Bernhard Kley | Friedrich-Schiller-Universität Jena |
| Andreas Tünnermann | Friedrich-Schiller-Universität Jena |
Films
Plasma TiO2
Film/Plasma Properties
Characteristic: Thickness
Analysis: Ellipsometry
Characteristic: Refractive Index
Analysis: Ellipsometry
Characteristic: Transmittance
Analysis: Optical Transmission
Characteristic: Reflectivity
Analysis: Optical Reflectivity
Substrates
| SiO2 |
Notes
| 877 |
