Publication Information

Title: Strongly Disordered TiN and NbTiN s-Wave Superconductors Probed by Microwave Electrodynamics

Type: Journal

Info: Phys. Rev. Lett. 109, 107003, 2012

Date: 2012-05-08

DOI: http://dx.doi.org/10.1103/PhysRevLett.109.107003

Author Information

Name

Institution

Delft University of Technology

Delft University of Technology

Delft University of Technology

Delft University of Technology

Delft University of Technology

Films

Deposition Temperature = 400C

7550-45-0

7727-37-9

1333-74-0

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Thickness

Profilometry

-

Crystallinity, Crystal Structure, Grain Size, Atomic Structure

AFM, Atomic Force Microscopy

-

Resistivity, Sheet Resistance

-

-

Carrier Concentration

Hall Measurements

-

Superconductivity

-

-

Substrates

SiO2

Silicon

Keywords

Superconductor

Notes

668



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