Strongly Disordered TiN and NbTiN s-Wave Superconductors Probed by Microwave Electrodynamics
Type:
Journal
Info:
Phys. Rev. Lett. 109, 107003, 2012
Date:
2012-05-08
Author Information
| Name | Institution |
|---|---|
| E. F. C. Driessen | Delft University of Technology |
| P. C. J. J. Coumou | Delft University of Technology |
| R. R. Tromp | Delft University of Technology |
| P. J. de Visser | Delft University of Technology |
| T. M. Klapwijk | Delft University of Technology |
Films
Plasma TiN
Film/Plasma Properties
Characteristic: Thickness
Analysis: Profilometry
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: AFM, Atomic Force Microscopy
Characteristic: Resistivity, Sheet Resistance
Analysis: -
Characteristic: Carrier Concentration
Analysis: Hall Measurements
Characteristic: Superconductivity
Analysis: -
Substrates
| SiO2 |
| Silicon |
Notes
| 668 |