Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation
Type:
Journal
Info:
Microelectronics Reliability 54 (2014) 2349-2354
Date:
2014-06-18
Author Information
| Name | Institution |
|---|---|
| Maria Gloria Cano de Andrade | UNESP - Univ Estadual Paulista |
| Joao Antonio Martino | University of Sao Paulo |
| Marc Aoulaiche | IMEC |
| Nadine Collaert | IMEC |
| Eddy Simoen | IMEC |
| Cor Claeys | IMEC |
Films
Film/Plasma Properties
Substrates
Notes
| 215 |