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Publication Information

Title: Electrical Measurement Under Atmospheric Conditons of PbSe Nanocrystal Thin Films Passivated by Remote Plasma Atomic Layer Deposition of Al2O3

Type: Journal

Info: IEEE TRANSACTIONS ON NANOTECHNOLOGY, VOL. 12, NO.2, March 2013

Date: 2012-12-11

DOI: http://dx.doi.org/10.1109/TNANO.2012.2234761

Author Information

Name

Institution

U.S. Naval Research Laboratory

U.S. Naval Research Laboratory

U.S. Naval Research Laboratory

U.S. Naval Research Laboratory

U.S. Naval Academy

U.S. Naval Research Laboratory

Films

Deposition Temperature = 150C

75-24-1

7782-44-7

Plasma HfO2 using Unknown

Deposition Temperature = 250C

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Electrical Properties

I-V, Current-Voltage Measurements

HP 4145B Semiconductor Parameter Analyzer

Mobility

I-V, Current-Voltage Measurements

HP 4145B Semiconductor Parameter Analyzer

Images

SEM, Scanning Electron Microscopy

Unknown

Substrates

Silicon

PbSe

Keywords

Passivation

Notes

646


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