Electrical Measurement Under Atmospheric Conditons of PbSe Nanocrystal Thin Films Passivated by Remote Plasma Atomic Layer Deposition of Al2O3
Type:
Journal
Info:
IEEE TRANSACTIONS ON NANOTECHNOLOGY, VOL. 12, NO.2, March 2013
Date:
2012-12-11
Author Information
| Name | Institution |
|---|---|
| W. Yoon | U.S. Naval Research Laboratory |
| A. R. Smith | U.S. Naval Research Laboratory |
| Edward Foos | U.S. Naval Research Laboratory |
| J. E. Boercker | U.S. Naval Research Laboratory |
| W. B. Heuer | U.S. Naval Academy |
| J. G. Tischler | U.S. Naval Research Laboratory |
Films
Plasma Al2O3
Film/Plasma Properties
Characteristic: Electrical Properties
Analysis: I-V, Current-Voltage Measurements
Characteristic: Mobility
Analysis: I-V, Current-Voltage Measurements
Characteristic: Images
Analysis: SEM, Scanning Electron Microscopy
Substrates
| Silicon |
| PbSe |
Notes
| 646 |