Nanoscopic structural rearrangements of the Cu-filament in conductive-bridge memories
Type:
Journal
Info:
Nanoscale 2016, Volume 8, Issue 29, pp 13915-13923
Date:
2016-01-24
Author Information
| Name | Institution |
|---|---|
| U. Celano | KU Leuven |
| G. Giammaria | KU Leuven |
| L. Goux | IMEC |
| A. Belmonte | KU Leuven |
| M. Jurczak | KU Leuven |
| Wilfried Vandervorst | KU Leuven |
Films
Film/Plasma Properties
Characteristic: Images
Analysis: TEM, Transmission Electron Microscope
Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Substrates
| Cu |
Notes
| 761 |