Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate
Type:
Journal
Info:
Microelectronics Reliability 2015
Date:
2015-11-30
Author Information
| Name | Institution |
|---|---|
| Gaudenzio Meneghesso | University of Padova |
| Matteo Meneghini | University of Padova |
| Davide Bisi | University of Padova |
| Isabella Rossetto | University of Padova |
| Tian-Li Wu | IMEC |
| Marleen Van Hove | IMEC |
| Denis Marcon | IMEC |
| Steve Stoffels | IMEC |
| Stefaan Decoutere | IMEC |
| Enrico Zanoni | University of Padova |
Films
Film/Plasma Properties
Substrates
Notes
| 429 |