Electrodynamic response and local tunneling spectroscopy of strongly disordered superconducting TiN films
Type:
Journal
Info:
Phys. Rev. B 88, 180505, 2013
Date:
2013-10-10
Author Information
| Name | Institution |
|---|---|
| P. C. J. J. Coumou | Delft University of Technology |
| E. F. C. Driessen | CEA - INAC |
| J. Bueno | SRON National Institute for Space Research |
| C. Chapelier | CEA - INAC |
| T. M. Klapwijk | Delft University of Technology |
Films
Film/Plasma Properties
Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: TEM, Transmission Electron Microscope
Characteristic: Resistivity, Sheet Resistance
Analysis: Hall Bar Structures
Characteristic: Superconductivity
Analysis: -
Substrates
| Si(100) |
Notes
| Paper available as chapter 6 in on-line thesis. |
| 679 |