
Investigation of field-effect passivation and interface state parameters at the Al2O3/Si interface
Type:
Journal
Info:
27th European Photovoltaic Solar Energy Conference and Exhibition
Date:
2012-09-24
Author Information
Name | Institution |
---|---|
Wensheng Liang | The Australian National University |
Klaus J. Weber | The Australian National University |
Dongchul Suh | The Australian National University |
Yongling Ren | The Australian National University |
Films
Plasma Al2O3
Film/Plasma Properties
Characteristic: Surface Recombination Velocity
Analysis: Corona Charge
Characteristic: Lifetime
Analysis: Lifetime Testing
Characteristic: Capacitance
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Interface Trap Density
Analysis: C-V, Capacitance-Voltage Measurements
Characteristic: Flat Band Voltage Shift
Analysis: C-V, Capacitance-Voltage Measurements
Substrates
Si(100) |
Keywords
Solar |
Notes
1369 |