Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs
Type:
Journal
Info:
Microelectronics Reliability Volume 55, Issues 9-10, August-September 2015, Pages 1692-1696
Date:
2015-06-29
Author Information
| Name | Institution |
|---|---|
| Isabella Rossetto | University of Padova |
| Matteo Meneghini | University of Padova |
| Davide Bisi | University of Padova |
| A. Barbato | University of Padova |
| Marleen Van Hove | IMEC |
| Denis Marcon | IMEC |
| Tian-Li Wu | IMEC |
| Stefaan Decoutere | IMEC |
| Gaudenzio Meneghesso | University of Padova |
| Enrico Zanoni | University of Padova |
Films
Film/Plasma Properties
Characteristic: Transistor Characteristics
Analysis: -
Substrates
| AlGaN |
| GaN |
Notes
| 489 |