Chemical Reaction and Ion Bombardment Effects of Plasma Radicals on Optoelectrical Properties of SnO2 Thin Films via Atomic Layer Deposition
Info:
Materials 2021, 14, 690
Author Information
Films
Film/Plasma Properties
Analysis: UV-VIS Spectroscopy
Analysis: UV-VIS Spectroscopy
Analysis: UV-VIS Spectroscopy
Analysis: OES, Optical Emission Spectroscopy
Analysis: XPS, X-ray Photoelectron Spectroscopy
Analysis: Hall Measurements
Analysis: Hall Measurements
Analysis: Hall Measurements
Analysis: Four-point Probe
Analysis: XRD, X-Ray Diffraction
Substrates
Notes