Analog/RF Study of Self-aligned In0.53Ga0.47As MOSFET with Scaled Gate Length
Type:
Journal
Info:
Journal of Electronic Materials Volume 46, Issue 2, 2017, Pages 782--789
Date:
2016-10-03
Author Information
Name | Institution |
---|---|
Arash Dehzangi | Northwestern University |
Farhad Larki | Universiti Kebangsaan Malaysia |
M. F. Mohd Razip Wee | Universiti Kebangsaan Malaysia |
Nicolas Wichmann | Université Lille |
Burhanuddin Y. Majlis | Universiti Kebangsaan Malaysia |
Sylvain Bollaert | Université Lille |
Films
Thermal Al2O3
Plasma Al2O3
Film/Plasma Properties
Substrates
InGaAs |
Notes
840 |