Publication Information

Title:
Minority carrier lifetime limitations in Si wafer solar cells with gallium phosphide window layers
Type:
Journal
Info:
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Date:
2016-06-05

Author Information

Name Institution
S. JanzFraunhofer Institute for Solar Energy Systems (ISE)
M. FeifelFraunhofer Institute for Solar Energy Systems (ISE)
J. OhlmannFraunhofer Institute for Solar Energy Systems (ISE)
J. BenickFraunhofer Institute for Solar Energy Systems (ISE)
C. WeissFraunhofer Institute for Solar Energy Systems (ISE)
M. HermleFraunhofer Institute for Solar Energy Systems (ISE)
A. W. BettFraunhofer Institute for Solar Energy Systems (ISE)
F. DimrothFraunhofer Institute for Solar Energy Systems (ISE)
D. LacknerFraunhofer Institute for Solar Energy Systems (ISE)

Films

Plasma Al2O3


Film/Plasma Properties

Characteristic: Minority Carrier Lifetime
Analysis: QSSPC, Quasi-Steady-State PhotoConductance Decay

Substrates

Silicon

Keywords

Solar

Notes

951