Charge effects of ultrafine FET with nanodot type floating gate
Type:
Conference Proceedings
Info:
2016 23rd International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)
Date:
2016-07-06
Author Information
Name | Institution |
---|---|
T. Ban | Ryukoku University |
S. Migita | National Institute of Advanced Industrial Science and Technology |
Yukiharu Uraoka | Nara Institute of Science and Technology |
S. I. Yamamoto | Ryukoku University |
Films
Film/Plasma Properties
Substrates
Notes
921 |