Simple plasma assisted atomic layer deposition technique for high substitutional nitrogen doping of TiO2

Type:
Journal
Info:
Journal of Vacuum Science & Technology A 36, 031602 (2018)
Date:
2018-02-18

Author Information

Name Institution
Abdullah H. AlshehriUniversity of Waterloo
Nathan Nelson-FitzpatrickUniversity of Waterloo
Khaled H. IbrahimUniversity of Waterloo
Kissan MistryUniversity of Waterloo
Mustafa YavuzUniversity of Waterloo
Kevin P. MusselmanUniversity of Waterloo

Films

Plasma TiON


Plasma TiO2


Film/Plasma Properties

Characteristic: Transmittance
Analysis: UV-VIS Spectroscopy

Characteristic: Reflectance Spectra
Analysis: UV-VIS Spectroscopy

Characteristic: Extinction Coefficient
Analysis: UV-VIS Spectroscopy

Characteristic: Optical Bandgap
Analysis: UV-VIS Spectroscopy

Characteristic: Optical Properties
Analysis: UV-VIS Spectroscopy

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Refractive Index
Analysis: Ellipsometry

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy

Substrates

Si(100)
Glass

Notes

1547