
Conformal Fe, Co and Ni Films from Oxides and Nitrides Grown by Atomic Layer Deposition
Type:
Poster
Info:
ALD 2012 Poster
Date:
2012-06-18
DOI:
No DOI
Author Information
| Name | Institution |
|---|---|
| Guo Liu | Cambridge NanoTech |
| Eric W. Deguns | Cambridge NanoTech |
| Ganesh M. Sundaram | Cambridge NanoTech |
| Jill S. Becker | Cambridge NanoTech |
Films
Plasma Ni
Plasma Fe
Film/Plasma Properties
Characteristic: Chemical Composition, Impurities
Analysis: SIMS, Secondary Ion Mass Spectrometry
Characteristic: Resistivity, Sheet Resistance
Analysis: Four-point Probe
Characteristic: Thickness
Analysis: Ellipsometry
Substrates
| SiO2 |
Notes
| 127 |
