Conformal Fe, Co and Ni Films from Oxides and Nitrides Grown by Atomic Layer Deposition
Type:
Poster
Info:
ALD 2012 Poster
Date:
2012-06-18
DOI:
No DOI
Author Information
Name | Institution |
---|---|
Guo Liu | Cambridge NanoTech |
Eric W. Deguns | Cambridge NanoTech |
Ganesh M. Sundaram | Cambridge NanoTech |
Jill S. Becker | Cambridge NanoTech |
Films
Plasma Ni
Plasma Fe
Film/Plasma Properties
Characteristic: Chemical Composition, Impurities
Analysis: SIMS, Secondary Ion Mass Spectrometry
Characteristic: Resistivity, Sheet Resistance
Analysis: Four-point Probe
Characteristic: Thickness
Analysis: Ellipsometry
Substrates
SiO2 |
Notes
127 |