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Self-assembled monolayers as a defect sealant of Al2O3 barrier layers grown by atomic layer deposition
Type:
Journal
Info:
Organic Electronics, Volume 52, 2018, Pages 98 - 102
Date:
2017-10-05
Author Information
| Name | Institution |
|---|---|
| Hyun Gi Kim | Kyung Hee University |
| Jong Geol Lee | Kyung Hee University |
| Sung Soo Kim | Kyung Hee University |
Films
Plasma Al2O3
Film/Plasma Properties
Characteristic: Water Vapor Transmission Rate (WVTR)
Analysis: Water Vapor Transmission Rate (WVTR)
Characteristic: Wetting Angle
Analysis: Contact Angle Measurement
Characteristic: Morphology, Roughness, Topography
Analysis: TEM, Transmission Electron Microscope
Characteristic: Chemical Composition, Impurities
Analysis: EDS, EDX, Energy Dispersive X-ray Spectroscopy
Characteristic: Flexibility
Analysis: Bending Test, Four Point Bend Delamination Test
Characteristic: UV-Vis Transmission
Analysis: Optical Transmission
Substrates
| PEN, Polyethylene Napthalate |
| Ag |
Notes
| 1128 |