Publication Information

Title: Self-assembled monolayers as a defect sealant of Al2O3 barrier layers grown by atomic layer deposition

Type: Journal

Info: Organic Electronics, Volume 52, 2018, Pages 98 - 102

Date: 2017-10-05

DOI: https://doi.org/10.1016/j.orgel.2017.10.004

Author Information

Name

Institution

Kyung Hee University

Kyung Hee University

Kyung Hee University

Films

Deposition Temperature = 120C

75-24-1

7782-44-7

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Water Vapor Transmission Rate (WVTR)

Water Vapor Transmission Rate (WVTR)

Mocon Aquatron Model 2

Wetting Angle

Contact Angle Measurement

SEO Ltd., Phoenix 300

Morphology, Roughness, Topography

TEM, Transmission Electron Microscope

JEOL 2100F

Chemical Composition, Impurities

EDS, EDX, Energy Dispersive X-ray Spectroscopy

Oxford Instruments INCA X-Sight

Flexibility

Bending Test, Four Point Bend Delamination Test

YUASA TCDM-111 U-Folding test system

UV-Vis Transmission

Optical Transmission

Otsuka MCPD-3000

Substrates

PEN, Polyethylene Napthalate

Ag

Keywords

Diffusion Barrier

Encapsulation

Notes

1128



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