Publication Information

Title:
Self-assembled monolayers as a defect sealant of Al2O3 barrier layers grown by atomic layer deposition
Type:
Journal
Info:
Organic Electronics, Volume 52, 2018, Pages 98 - 102
Date:
2017-10-05

Author Information

Name Institution
Hyun Gi KimKyung Hee University
Jong Geol LeeKyung Hee University
Sung Soo KimKyung Hee University

Films

Plasma Al2O3


Film/Plasma Properties

Characteristic: Water Vapor Transmission Rate (WVTR)
Analysis: Water Vapor Transmission Rate (WVTR)

Characteristic: Wetting Angle
Analysis: Contact Angle Measurement

Characteristic: Morphology, Roughness, Topography
Analysis: TEM, Transmission Electron Microscope

Characteristic: Chemical Composition, Impurities
Analysis: EDS, EDX, Energy Dispersive X-ray Spectroscopy

Characteristic: Flexibility
Analysis: Bending Test, Four Point Bend Delamination Test

Characteristic: UV-Vis Transmission
Analysis: Optical Transmission

Substrates

PEN, Polyethylene Napthalate
Ag

Keywords

Diffusion Barrier
Encapsulation

Notes

1128