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Publication Information
Title:
Band offset of Al1-xSixOy mixed oxide on GaN evaluated by hard X-ray photoelectron spectroscopy
Type:
Journal
Info:
Japanese Journal of Applied Physics 56, 04CG07 (2017)
Date:
2016-12-28
Author Information
Name | Institution |
---|---|
Kenji Itoh | Toyota Central Research and Development Laboratories |
Daigo Kikuta | Toyota Central Research and Development Laboratories |
Tetsuo Narita | Toyota Central Research and Development Laboratories |
Keita Kataoka | Toyota Central Research and Development Laboratories |
Noritake Isomura | Toyota Central Research and Development Laboratories |
Kousuke Kitazumi | Toyota Central Research and Development Laboratories |
Tomohiko Mori | Toyota Central Research and Development Laboratories |
Films
Plasma AlSixOy
Film/Plasma Properties
Characteristic: Band Gap
Analysis: HAXPES, Hard X-Ray Photoelectron Spectroscopy
Characteristic: Valence Band
Analysis: HAXPES, Hard X-Ray Photoelectron Spectroscopy
Substrates
GaN |
Silicon |
Keywords
Notes
986 |
Popular Precursors
Top Authors
Erwin (W.M.M.) Kessels |
Hyeongtag Jeon |
Hyungjun Kim |
Mauritius C. M. (Richard) van de Sanden |
Christophe Detavernier |