Highly stable all-inorganic CsPbBr3 nanocrystals film encapsulated with alumina by plasma-enhanced atomic layer deposition
Type:
Journal
Info:
Mater. Express, Vol. 8, No. 5, 2018
Date:
2018-08-14
Author Information
| Name | Institution |
|---|---|
| Yiyuan Zhu | Nanchang University |
| Yuandan He | Nanchang University |
| Jinhui Gong | Nanchang University |
| Xingcan Feng | Nanchang University |
| Hong Peng | Nanchang University |
| Wei Wang | Nanchang University |
| Haiyang He | Nanchang University |
| Hu Liu | Nanchang University |
| Li Wang | Nanchang University |
Films
Plasma Al2O3
Thermal Al2O3
Film/Plasma Properties
Characteristic: Thickness
Analysis: Ellipsometry
Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy
Characteristic: Interfacial Layer
Analysis: XPS, X-ray Photoelectron Spectroscopy
Substrates
| Silicon |
| CsPbBr3 |
Notes
| 1282 |