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Enhancement of the Electrical Properties of Ga-doped ZnO Thin Films on Polycarbonate Substrates by Using a TiO2 Buffer Layer
Type:
Journal
Info:
Journal of the Korean Physical Society, Vol. 51, No. 5, pp. 1732-1735
Date:
2007-07-07
Author Information
| Name | Institution |
|---|---|
| Yeon-Keon Moon | Hanyang University |
| Se Hyun Kim | Hanyang University |
| Dae-Young Moon | Hanyang University |
| Woong-Sun Kim | Hanyang University |
| Jong-Wan Park | Hanyang University |
Films
Film/Plasma Properties
Characteristic: Thickness
Analysis: Profilometry
Characteristic: Thickness
Analysis: SEM, Scanning Electron Microscopy
Characteristic: Images
Analysis: SEM, Scanning Electron Microscopy
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Characteristic: Stress
Analysis: XRD, X-Ray Diffraction
Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Characteristic: Resistivity, Sheet Resistance
Analysis: van der Pauw sheet resistance
Substrates
| Polycarbonate |
Notes
| 1322 |