Electrical characterizations of MIS structures based on variable-gap n(p)-HgCdTe grown by MBE on Si(0 1 3) substrates

Type:
Journal
Info:
Infrared Physics & Technology 87 (2017) 129-133
Date:
2017-10-22

Author Information

Name Institution
Alexander VoitsekhovskiiNational Research Tomsk State University
Sergey NesmelovNational Research Tomsk State University
Stanislav DzyadukhNational Research Tomsk State University
V.S. VaravinRussian Academy of Sciences
S.A. DvoretskiiNational Research Tomsk State University
N.N. MikhailovRussian Academy of Sciences
M.V. YakushevRussian Academy of Sciences
G.Yu. SidorovRussian Academy of Sciences

Films

Plasma Al2O3


Film/Plasma Properties

Substrates

HgCdTe

Notes

1077