Publication Information

Title: Capacitance spectroscopy of gate-defined electronic lattices

Type: Journal

Info: Arxiv.org preprint

Date: 2017-09-26

DOI: https://arxiv.org/abs/1709.09058v1

Author Information

Name

Institution

Delft University of Technology

Delft University of Technology

Delft University of Technology

Delft University of Technology

Delft University of Technology

Purdue University

Purdue University

ETH Zürich

ETH Zürich

Purdue University

Delft University of Technology

Films

Plasma Al2O3 using Unknown

Deposition Temperature Range N/A

75-24-1

7782-44-7

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Adhesion

Unknown

-

Hysteresis

Unknown

-

Substrates

Keywords

Notes

1057



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