Capacitance spectroscopy of gate-defined electronic lattices
Type:
Journal
Info:
Arxiv.org preprint
Date:
2017-09-26
Author Information
| Name | Institution |
|---|---|
| T. Hensgens | Delft University of Technology |
| U. Mukhopadhyay | Delft University of Technology |
| P. Barthelemy | Delft University of Technology |
| R. F. L. Vermeulen | Delft University of Technology |
| R. N. Schouten | Delft University of Technology |
| S. Fallahi | Purdue University |
| G. C. Gardner | Purdue University |
| C. Reichl | ETH Zürich |
| W. Wegscheider | ETH Zürich |
| Michael J. Manfra | Purdue University |
| L. M. K. Vandersypen | Delft University of Technology |
Films
Film/Plasma Properties
Characteristic: Adhesion
Analysis: -
Characteristic: Hysteresis
Analysis: -
Substrates
Notes
| 1057 |