Title: Characteristics of Charge Trap Flash Memory with Al2O3/(Ta/Nb)Ox/Al2O3 Multi-Layer
Type: Conference Proceedings
Info: ECS Trans. 2014 volume 61, issue 2, 293-300
Date: 2014-08-24
DOI: http://dx.doi.org/10.1149/06102.0293ecst
Name
Institution
National Institute for Materials Science (NIMS)
Characteristic
Analysis
Diagnostic
Flat Band Voltage Shift
Unknown
Unknown
Flash Memory
Capacitors
244
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