Fully CMOS-compatible titanium nitride nanoantennas

Type:
Journal
Info:
Applied Physics Letters 108, 051110 (2016)
Date:
2016-01-24
DOI:
http://dx.doi.org/10.1063/1.4941413

Author Information

Name Institution
Justin A. BriggsStanford University
Gururaj V. NaikStanford University
Trevor A. PetachStanford University
Brian K. BaumStanford University
David Goldhaber-GordonStanford University
Jennifer A. DionneStanford University

Films

Plasma TiN

Hardware used: Veeco - Ultratech - Cambridge NanoTech Fiji
TDMATi, tetrakis(dimethylamido)titanium, titanium dimethylamide, (Me2N)4Ti
CAS#: 3275-24-9
Where to buy precursor
N2, Nitrogen
CAS#: 7727-37-9
Deposition Temperature = 250C

Film/Plasma Properties

Characteristic: Optical Properties
Analysis: Ellipsometry
Diagnostic: J.A. Woollam VASE

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy
Diagnostic: PHI VersaProbe 5000

Characteristic: Compositional Depth Profiling
Analysis: XPS, X-ray Photoelectron Spectroscopy
Diagnostic: PHI VersaProbe 5000

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Diagnostic: Synchrotron

Characteristic: Resistivity, Sheet Resistance
Analysis: van der Pauw sheet resistance
Diagnostic: -

Characteristic: Resistivity, Sheet Resistance
Analysis: van der Pauw sheet resistance
Diagnostic: -

Substrates

MgO

Notes

Good information in supplement.
763