Gate-tunable high mobility remote-doped InSb/In1-xAlxSb quantum well heterostructures
Type:
Journal
Info:
Appl. Phys. Lett. 106, 142103 (2015)
Date:
2015-03-26
Author Information
Name | Institution |
---|---|
Wei Yi | HRL Laboratories |
Andrey A. Kiselev | HRL Laboratories |
Jacob Thorp | HRL Laboratories |
Ramsey Noah | HRL Laboratories |
Binh-Minh Nguyen | HRL Laboratories |
Steven Bui | HRL Laboratories |
Rajesh D. Rajavel | HRL Laboratories |
Tahir Hussain | HRL Laboratories |
Mark Gyure | HRL Laboratories |
Philip Kratz | Stanford University |
Qi Qian | Purdue University |
Michael J. Manfra | Purdue University |
Vlad S. Pribiag | Delft University of Technology |
Leo P. Kouwenhoven | Delft University of Technology |
Charles M. Marcus | University of Copenhagen |
Marko Sokolich | HRL Laboratories |
Films
Plasma HfO2
Film/Plasma Properties
Characteristic: Breakdown Voltage
Analysis: -
Characteristic: Thickness
Analysis: -
Characteristic: Refractive Index
Analysis: -
Characteristic: Dielectric Constant, Permittivity
Analysis: -
Characteristic: Interface Trap Density
Analysis: -
Substrates
InSb |
Notes
Predeposition treatments with N2 plasma and TMA pulses. |
Ultratech Fiji PEALD HfO2 gate dielectric for improved InSb/In1-xAlxSb quantum well heterostructure. |
304 |