
Gas sensing properties in epitaxial SnO2 films grown on TiO2 single crystals with various orientations
Type:
Journal
Info:
Sensors and Actuators B 147 (2010) 653-659
Date:
2010-03-27
Author Information
| Name | Institution |
|---|---|
| Dai-Hong Kim | Seoul National University |
| Won-Sik Kim | Seoul National University |
| Sung Bo Lee | Seoul National University |
| Seong-Hyeon Hong | Seoul National University |
Films
Film/Plasma Properties
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: X-ray Pole Figure
Characteristic: Microstructure
Analysis: TEM, Transmission Electron Microscope
Characteristic: Microstructure
Analysis: TEM, Transmission Electron Microscope
Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy
Characteristic: Bonding States
Analysis: XPS, X-ray Photoelectron Spectroscopy
Characteristic: Gas Sensing
Analysis: Custom
Substrates
| TiO2(100) |
| TiO2(001) |
| TiO2(110) |
| TiO2(101) |
Notes
| 600C post deposition anneal. |
| 123 |
