Gas sensing properties in epitaxial SnO2 films grown on TiO2 single crystals with various orientations
Info:
Sensors and Actuators B 147 (2010) 653-659
Author Information
Films
Film/Plasma Properties
Analysis: XRD, X-Ray Diffraction
Analysis: X-ray Pole Figure
Analysis: TEM, Transmission Electron Microscope
Analysis: TEM, Transmission Electron Microscope
Analysis: AFM, Atomic Force Microscopy
Analysis: XPS, X-ray Photoelectron Spectroscopy
Substrates
| TiO2(100) |
| TiO2(001) |
| TiO2(110) |
| TiO2(101) |
Notes
| 600C post deposition anneal. |
| 123 |