The Influence of Technology and Switching Parameters on Resistive Switching Behavior of Pt/HfO2/TiN MIM Structures

Type:
Journal
Info:
Facta universitatis - series: Electronics and Energetics 2014 Volume 27, Issue 4, Pages: 621-630
Date:
2014-07-21

Author Information

Name Institution
Albena PaskalevaBulgarian Academy of Sciences

Films



Film/Plasma Properties

Substrates

Notes

197