Reliability and parasitic issues in GaN-based power HEMTs: a review
Type:
Journal
Info:
2016 Semicond. Sci. Technol. 31, 093004
Date:
2016-06-22
Author Information
| Name | Institution |
|---|---|
| Gaudenzio Meneghesso | University of Padova |
| Matteo Meneghini | University of Padova |
| Isabella Rossetto | University of Padova |
| Davide Bisi | University of Padova |
| Steve Stoffels | IMEC |
| Marleen Van Hove | IMEC |
| Stefaan Decoutere | IMEC |
| Enrico Zanoni | University of Padova |
Films
Film/Plasma Properties
Substrates
| GaN |
Notes
| 964 |