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Co/CoP Nanoparticles Encapsulated Within N, P-Doped Carbon Nanotubes on Nanoporous Metal-Organic Framework Nanosheets for Oxygen Reduction and Oxygen Evolution Reactions
Nanolaminated Al2O3/HfO2 dielectrics for silicon carbide based devices
Development of Space Divided PE-ALD System and Process Design for Gap-Fill Process in Advanced Memory Devices
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Publication Information
Title:
Reliability and parasitic issues in GaN-based power HEMTs: a review
Type:
Journal
Info:
2016 Semicond. Sci. Technol. 31, 093004
Date:
2016-06-22
Author Information
| Name | Institution |
|---|---|
| Gaudenzio Meneghesso | University of Padova |
| Matteo Meneghini | University of Padova |
| Isabella Rossetto | University of Padova |
| Davide Bisi | University of Padova |
| Steve Stoffels | IMEC |
| Marleen Van Hove | IMEC |
| Stefaan Decoutere | IMEC |
| Enrico Zanoni | University of Padova |
Films
Film/Plasma Properties
Substrates
| GaN |
Keywords
Notes
| 964 |
Popular Precursors
Top Authors
| Erwin (W.M.M.) Kessels |
| Hyeongtag Jeon |
| Hyungjun Kim |
| Mauritius C. M. (Richard) van de Sanden |
| Christophe Detavernier |