Publication Information

Title:
Unexpectedly High Minority-Carrier Lifetimes Exceeding 20 ms Measured on 1.4-Ohm cm n-Type Silicon Wafers
Type:
Journal
Info:
Phys. Status Solidi RRL 2017, 1700235
Date:
2017-09-02

Author Information

Name Institution
Boris Veith-WolfInstitute for Solar Energy Research Hamelin (ISFH)
Jan SchmidtInstitute for Solar Energy Research Hamelin (ISFH)

Films

Plasma Al2O3


Film/Plasma Properties

Characteristic: Minority Carrier Lifetime
Analysis: QSSPC, Quasi-Steady-State PhotoConductance Decay

Substrates

Silicon

Keywords

Solar

Notes

1142