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Unexpectedly High Minority-Carrier Lifetimes Exceeding 20 ms Measured on 1.4-Ohm cm n-Type Silicon Wafers
Type:
Journal
Info:
Phys. Status Solidi RRL 2017, 1700235
Date:
2017-09-02
Author Information
| Name | Institution |
|---|---|
| Boris Veith-Wolf | Institute for Solar Energy Research Hamelin (ISFH) |
| Jan Schmidt | Institute for Solar Energy Research Hamelin (ISFH) |
Films
Plasma Al2O3
Film/Plasma Properties
Characteristic: Minority Carrier Lifetime
Analysis: QSSPC, Quasi-Steady-State PhotoConductance Decay
Substrates
| Silicon |
Notes
| 1142 |