Publication Information

Title: Low-Temperature Plasma-Assisted Atomic-Layer-Deposited SnO2 as an Electron Transport Layer in Planar Perovskite Solar Cells

Type: Journal

Info: ACS Appl. Mater. Interfaces, 2018, 10 (36), pp 30367-30378

Date: 2018-08-16

DOI: http://dx.doi.org/10.1021/acsami.8b09515

Author Information

Name

Institution

Eindhoven University of Technology

TNO

Eindhoven University of Technology

Eindhoven University of Technology

Eindhoven University of Technology

Eindhoven University of Technology

Eindhoven University of Technology

Eindhoven University of Technology

Solliance Solar Research

TNO

Eindhoven University of Technology

Eindhoven University of Technology

Films

Deposition Temperature Range = 50-200C

1066-77-9

7782-44-7

Film/Plasma Properties

Characteristic

Analysis

Diagnostic

Thickness

Ellipsometry

J.A. Woollam M-2000

Refractive Index

Ellipsometry

J.A. Woollam M-2000

Extinction Coefficient

Ellipsometry

J.A. Woollam M-2000

Transmittance

Ellipsometry

J.A. Woollam M-2000

Reflectance Spectra

Ellipsometry

J.A. Woollam M-2000

Chemical Composition, Impurities

XPS, X-ray Photoelectron Spectroscopy

Thermo Scientific K-Alpha

Chemical Composition, Impurities

RBS, Rutherford Backscattering Spectrometry

-

Density

RBS, Rutherford Backscattering Spectrometry

-

Chemical Composition, Impurities

TOF-ERDA, Time-Of-Flight Elastic Recoil Detection Analysis

-

Crystallinity, Crystal Structure, Grain Size, Atomic Structure

XRD, X-Ray Diffraction

PANalytical Xpert PRO MRD X-ray Diffractometer

Morphology, Roughness, Topography

AFM, Atomic Force Microscopy

Veeco Dimension 3100

Crystallinity, Crystal Structure, Grain Size, Atomic Structure

TEM, Transmission Electron Microscope

JEOL JEM ARM 200

Chemical Composition, Impurities

EDS, EDX, Energy Dispersive X-ray Spectroscopy

JEOL JEM ARM 200

UV-Vis Transmission

UV-VIS Spectroscopy

Varian-Cary 5000 spectrophotometer

Chemical Composition, Impurities

UPS, Ultraviolet Photoemission Spectroscopy

VG EscaLab II

Band Gap

FTPS, Fourier Transform Photocurrent Spectroscopy

-

Short Circuit Current

I-V, Current-Voltage Measurements

Custom

Open Circuit Voltage

I-V, Current-Voltage Measurements

Custom

Fill Factor

I-V, Current-Voltage Measurements

Custom

Power Conversion Efficiency

I-V, Current-Voltage Measurements

Custom

Resistivity, Sheet Resistance

Hall Measurements

Ecopia HMS-5300

Photoluminescence

PL, PhotoLuminescence

Custom

Morphology, Roughness, Topography

SEM, Scanning Electron Microscopy

FEI Helios Nanolab600

Substrates

Si(100)

ITO

Keywords

Solar

Notes

1296



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