Publication Information

Title:
Low-Temperature Plasma-Assisted Atomic-Layer-Deposited SnO2 as an Electron Transport Layer in Planar Perovskite Solar Cells
Type:
Journal
Info:
ACS Appl. Mater. Interfaces, 2018, 10 (36), pp 30367-30378
Date:
2018-08-16

Author Information

Name Institution
Yinghuan KuangEindhoven University of Technology
Valerio ZardettoTNO
Roderick van GilsEindhoven University of Technology
Saurabh KarwalEindhoven University of Technology
Dibyashree KoushikEindhoven University of Technology
Marcel A. VerheijenEindhoven University of Technology
Lachlan E. BlackEindhoven University of Technology
Christ WeijtensEindhoven University of Technology
Sjoerd VeenstraSolliance Solar Research
Ronn AndriessenTNO
Erwin (W.M.M.) KesselsEindhoven University of Technology
Mariadriana CreatoreEindhoven University of Technology

Films


Film/Plasma Properties

Characteristic: Thickness
Analysis: Ellipsometry

Characteristic: Refractive Index
Analysis: Ellipsometry

Characteristic: Extinction Coefficient
Analysis: Ellipsometry

Characteristic: Transmittance
Analysis: Ellipsometry

Characteristic: Reflectance Spectra
Analysis: Ellipsometry

Characteristic: Chemical Composition, Impurities
Analysis: XPS, X-ray Photoelectron Spectroscopy

Characteristic: Chemical Composition, Impurities
Analysis: RBS, Rutherford Backscattering Spectrometry

Characteristic: Density
Analysis: RBS, Rutherford Backscattering Spectrometry

Characteristic: Chemical Composition, Impurities
Analysis: TOF-ERDA, Time-Of-Flight Elastic Recoil Detection Analysis

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction

Characteristic: Morphology, Roughness, Topography
Analysis: AFM, Atomic Force Microscopy

Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: TEM, Transmission Electron Microscope

Characteristic: Chemical Composition, Impurities
Analysis: EDS, EDX, Energy Dispersive X-ray Spectroscopy

Characteristic: UV-Vis Transmission
Analysis: UV-VIS Spectroscopy

Characteristic: Chemical Composition, Impurities
Analysis: UPS, Ultraviolet Photoemission Spectroscopy

Characteristic: Band Gap
Analysis: FTPS, Fourier Transform Photocurrent Spectroscopy

Characteristic: Short Circuit Current
Analysis: I-V, Current-Voltage Measurements

Characteristic: Open Circuit Voltage
Analysis: I-V, Current-Voltage Measurements

Characteristic: Fill Factor
Analysis: I-V, Current-Voltage Measurements

Characteristic: Power Conversion Efficiency
Analysis: I-V, Current-Voltage Measurements

Characteristic: Resistivity, Sheet Resistance
Analysis: Hall Measurements

Characteristic: Photoluminescence
Analysis: PL, PhotoLuminescence

Characteristic: Morphology, Roughness, Topography
Analysis: SEM, Scanning Electron Microscopy

Substrates

Si(100)
ITO

Keywords

Solar

Notes

1296