Spectroscopy and control of near-surface defects in conductive thin film ZnO
Type:
Journal
Info:
2016 J. Phys.: Condens. Matter 28 094007
Date:
2015-10-09
Author Information
Name | Institution |
---|---|
Leah L. Kelly | University of Arizona |
David A. Racke | University of Arizona |
Philip Schulz | National Renewable Energy Laboratory |
Hong Li | Georgia Institute of Technology |
Paul Winget | Georgia Institute of Technology |
Hyungchul (GaTech) Kim | Georgia Institute of Technology |
Paul F. Ndione | National Renewable Energy Laboratory |
Ajaya K. Sigdel | National Renewable Energy Laboratory |
Jean-Luc Brédas | King Abdullah University of Science and Technology |
Joseph J. Berry | National Renewable Energy Laboratory |
Samuel Graham | Georgia Institute of Technology |
Oliver L. A. Monti | University of Arizona |
Films
Film/Plasma Properties
Characteristic: Thickness
Analysis: Ellipsometry
Substrates
Silicon |
Notes
525 |