Spectroscopy and control of near-surface defects in conductive thin film ZnO
Type:
Journal
Info:
2016 J. Phys.: Condens. Matter 28 094007
Date:
2015-10-09
Author Information
| Name | Institution |
|---|---|
| Leah L. Kelly | University of Arizona |
| David A. Racke | University of Arizona |
| Philip Schulz | National Renewable Energy Laboratory |
| Hong Li | Georgia Institute of Technology |
| Paul Winget | Georgia Institute of Technology |
| Hyungchul (GaTech) Kim | Georgia Institute of Technology |
| Paul F. Ndione | National Renewable Energy Laboratory |
| Ajaya K. Sigdel | National Renewable Energy Laboratory |
| Jean-Luc Brédas | King Abdullah University of Science and Technology |
| Joseph J. Berry | National Renewable Energy Laboratory |
| Samuel Graham | Georgia Institute of Technology |
| Oliver L. A. Monti | University of Arizona |
Films
Film/Plasma Properties
Characteristic: Thickness
Analysis: Ellipsometry
Substrates
| Silicon |
Notes
| 525 |