Enhancement of reliability and stability for transparent amorphous indium-zinc-tin-oxide thin film transistors
Type:
Journal
Info:
RSC Adv., 2016, 6, 106374-106379
Date:
2016-11-03
Author Information
| Name | Institution |
|---|---|
| Po-Tsun Liu | National Chiao Tung University |
| Chih-Hsiang Chang | National Chiao Tung University |
| Chur-Shyang Fuh | National Chiao Tung University |
Films
Film/Plasma Properties
Substrates
| ITO |
| IZTO |
Notes
| 936 |