Tailoring Electron-Transfer Barriers for Zinc Oxide/C60 Fullerene Interfaces
Type:
Journal
Info:
Advanced Functional Materials Volume 24, Issue 46, pages 7381-7389, December 10, 2014
Date:
2014-10-01
Author Information
| Name | Institution |
|---|---|
| Philip Schulz | Princeton University |
| Leah L. Kelly | University of Arizona |
| Paul Winget | Georgia Institute of Technology |
| Hong Li | Georgia Institute of Technology |
| Hyungchul (GaTech) Kim | Georgia Institute of Technology |
| Paul F. Ndione | National Renewable Energy Laboratory |
| Ajaya K. Sigdel | National Renewable Energy Laboratory |
| Joseph J. Berry | National Renewable Energy Laboratory |
| Samuel Graham Jr. | Georgia Institute of Technology |
| Jean-Luc Brédas | Georgia Institute of Technology |
| Antoine Kahn | Princeton University |
| Oliver L. A. Monti | University of Arizona |
Films
Plasma ZnO
Film/Plasma Properties
Characteristic: Thickness
Analysis: Ellipsometry
Characteristic: Crystallinity, Crystal Structure, Grain Size, Atomic Structure
Analysis: XRD, X-Ray Diffraction
Substrates
| IZO, Indium Zinc Oxide |
Notes
| Ultratech Fiji PEALD ZnO for hybrid organic/inorganic electrode interface study. |
| 180 |